FEATURES

► Complete 16-bit data acquisition system

► Simultaneous sampling of 8 internally buffered channels

► 250 kSPS per channel throughput

► Differential, wide common-mode range inputs

► ±75 pA typical input leakage at 25°C

► Full-scale input step settling time < 300 ns

► Integrated reference and reference buffer (4.096 V)

► Integrated supply decoupling capacitors

► 27 mW per channel at 250 kSPS, scales with throughput

► Minimal external signal conditioning

► Seamless high dynamic range

► Per sample, per channel automatic gain ranging

► Maintains ppm-level INL

► Per channel SoftSpan input ranges, bipolar or unipolar

► ±40 V, ±25 V, ±20 V, ±12.5 V, ±10 V, ±6.25 V, ±5 V, ±2.5 V

► 0 V to 40 V, 25 V, 20 V, 12.5 V, 10 V, 6.25 V, 5 V, 2.5 V

► Rail-to-rail input overdrive tolerance

► High performance

► INL: ±160 μV typical (±40 V range)

► SNR: 94.6 dB single-conversion typical (±40 V range)

► DR: 98.1 dB single-conversion typical (±40 V range)

► THD: −117 dB typical (±40 V range)

► CMRR: 120 dB typical

► Digital flexibility

► SPI CMOS (0.9 V to 5.25 V) and LVDS serial input and output

► Optional oversampling with 16-bit digital averaging

► Optional offset, gain, and phase correction

► 7.00 mm × 7.00 mm, 64-ball BGA full solution footprint

APPLICATIONS

► Automatic test equipment

► Avionics and aerospace

► Instrumentation and control systems

► Semiconductor manufacturing

► Test and measurement