FEATURES

► Complete 20-bit data acquisition system

► Simultaneous sampling of 4 internally buffered channels

► 250kSPS per channel throughput

► Differential, wide common-mode range inputs

► ±75pA typical input leakage at 25°C

► Full-scale input step settling time < 300ns

► Integrated reference and reference buffer (4.096V)

► Integrated supply decoupling capacitors

► 36mW per channel at 250kSPS, scales with throughput

► Minimal external signal conditioning

► Seamless high dynamic range

► Per sample, per channel automatic gain ranging

► Maintains ppm-level INL

► Per channel SoftSpan input ranges, bipolar or unipolar

► ±40V, ±25V, ±20V, ±12.5V, ±10V, ±6.25V, ±5V, ±2.5V

► 0V to 40V, 25V, 20V, 12.5V, 10V, 6.25V, 5V, 2.5V

► Rail-to-rail input overdrive tolerance

► High performance

► INL: ±160μV typical (±40V range)

► SNR: 97.2dB single-conversion typical (±40V range)

► DR: 111.4dB single-conversion typical (±40V range)

► THD: −117dB typical (±40V range)

► CMRR: 120dB typical

► Digital flexibility

► SPI CMOS (0.9V to 5.25V) and LVDS serial input and output

► Optional oversampling with 24-bit digital averaging

► Optional offset, gain, and phase correction

► 7.00mm × 7.00mm, 64-ball BGA full solution footprint

APPLICATIONS

► Automatic test equipment

► Avionics and aerospace

► Instrumentation and control systems

► Semiconductor manufacturing

► Test and measurement