型号 功能描述 生产厂家&企业 LOGO 操作
APS12800

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

Two-WireHall-EffectLatchwithAdvancedDiagnostics

FEATURESANDBENEFITS •Functionalsafety ▫DevelopedinaccordancewithISO26262:2011 (pendingassessment) ▫DesignedtomeetASILBrequirements ▫Integratedbackgrounddiagnosticsfor: ◦Signalpath ◦Regulator ◦Hallplateandbias ◦Overtemperaturedetection ◦Nonvolatilememory ▫

Allegro

Allegro MicroSystems

Allegro

12ASnubberless,logiclevelandstandardtriacs

文件:138.75 Kbytes Page:12 Pages

STMICROELECTRONICSSTMicroelectronics

意法半导体意法半导体(ST)集团

STMICROELECTRONICS

12ASnubberless,logiclevelandstandardtriacs

文件:138.75 Kbytes Page:12 Pages

STMICROELECTRONICSSTMicroelectronics

意法半导体意法半导体(ST)集团

STMICROELECTRONICS

12ASnubberless,logiclevelandstandardtriacs

文件:138.75 Kbytes Page:12 Pages

STMICROELECTRONICSSTMicroelectronics

意法半导体意法半导体(ST)集团

STMICROELECTRONICS

12ASnubberless,logiclevelandstandardtriacs

文件:138.75 Kbytes Page:12 Pages

STMICROELECTRONICSSTMicroelectronics

意法半导体意法半导体(ST)集团

STMICROELECTRONICS
更新时间:2024-5-24 22:30:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
EVERLIG
2020+
80000
只做自己库存,全新原装进口正品假一赔百,可开13%增
AP Memory
23+
N/A
20000
深圳通
EVERLIGHT/亿光
23+
NA/
4750
原装现货,当天可交货,原型号开票
APMEMORY
22+
BGA
9852
只做原装正品现货,或订货假一赔十!
apmemory
21+
BGA
3700
原装现货假一赔十
APMEMORY
20+
BGA
9850
只做原装正品假一赔十为客户做到零风险!!
AP MEMORY TECHNOLOGY CORP.
22+
SMD
518000
明嘉莱只做原装正品现货
apmemory
21+
BGA
3700
优势代理渠道,原装正品,可全系列订货开增值税票
INFINERA
23+
BGA
168
原装正品,假一罚十!
APMEMORY
1933+
BGA-54
3173
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