AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors

1 Features • 256 channels • On-chip, 16-bit ADC • High performance: – Noise: 440 electrons RMS (1.2-pC input charge range) – Low correlated noise – Full-channel integral nonlinearity: ±2 LSB at 16 bit – Scan time:

AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors

1 Features • 256 channels • On-chip, 16-bit ADC • High performance: – Noise: 440 electrons RMS (1.2-pC input charge range) – Low correlated noise – Full-channel integral nonlinearity: ±2 LSB at 16 bit – Scan time:

AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors

1 Features • 256 channels • On-chip, 16-bit ADC • High performance: – Noise: 440 electrons RMS (1.2-pC input charge range) – Low correlated noise – Full-channel integral nonlinearity: ±2 LSB at 16 bit – Scan time:

适用于动态和半动态 X 射线平板检测器的 256 通道模拟前端 (AFE)

AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors

1 Features • 256 channels • On-chip, 16-bit ADC • High performance: – Noise: 440 electrons RMS (1.2-pC input charge range) – Low correlated noise – Full-channel integral nonlinearity: ±2 LSB at 16 bit – Scan time:

AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors

1 Features • 256 channels • On-chip, 16-bit ADC • High performance: – Noise: 440 electrons RMS (1.2-pC input charge range) – Low correlated noise – Full-channel integral nonlinearity: ±2 LSB at 16 bit – Scan time:

AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors

1 Features • 256 channels • On-chip, 16-bit ADC • High performance: – Noise: 440 electrons RMS (1.2-pC input charge range) – Low correlated noise – Full-channel integral nonlinearity: ±2 LSB at 16 bit – Scan time:

AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors

1 Features • 256 channels • On-chip, 16-bit ADC • High performance: – Noise: 440 electrons RMS (1.2-pC input charge range) – Low correlated noise – Full-channel integral nonlinearity: ±2 LSB at 16 bit – Scan time:

AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors

1 Features • 256 channels • On-chip, 16-bit ADC • High performance: – Noise: 440 electrons RMS (1.2-pC input charge range) – Low correlated noise – Full-channel integral nonlinearity: ±2 LSB at 16 bit – Scan time:

AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors

1 Features • 256 channels • On-chip, 16-bit ADC • High performance: – Noise: 440 electrons RMS (1.2-pC input charge range) – Low correlated noise – Full-channel integral nonlinearity: ±2 LSB at 16 bit – Scan time:

AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors

1 Features • 256 channels • On-chip, 16-bit ADC • High performance: – Noise: 440 electrons RMS (1.2-pC input charge range) – Low correlated noise – Full-channel integral nonlinearity: ±2 LSB at 16 bit – Scan time:

AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors

1 Features • 256 channels • On-chip, 16-bit ADC • High performance: – Noise: 440 electrons RMS (1.2-pC input charge range) – Low correlated noise – Full-channel integral nonlinearity: ±2 LSB at 16 bit – Scan time:

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