丝印代码：ABTH18652A；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Members of the Texas Instruments. Widebus™ Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Mult

丝印代码：ABTH18652A；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments Widebus Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

丝印代码：ABTH18652A；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments Widebus Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex