Members of the Texas Instruments

SCOPE ™ Family of Testability Products

Members of the Texas Instruments.

Widebus™ Family

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

Include D-Type Flip-Flops and Control

Circuitry to Provide Multiplexed

Transmission of Stored and Real-Time Data

Bus Hold on Data Inputs Eliminates the

Need for External Pullup Resistors

B-Port Outputs of ’ABTH182652A Devices

Have Equivalent 25-Q Series Resistors, So

No External Resistors Are Required

State-of-the-Art EPIC-IIB ™ BICMOS Design

One Boundary-Scan Cell Per 10

Architecture Improves Scan Efficiency

SCOPE ™ Instruction Set

- IEEE Standard 1149.1-1990 Required

Instructions and Optional CLAMP and

HIGHZ

- Parallel-Signature Analysis at Inputs

- Pseudo-Random Pattern Generation

From Outputs

- Sample Inputs/Toggle Outputs

- Binary Count From Outputs.

- Device Identification

- Even-Parity Opcodes

Packaged in 64-Pin Plastic Thin Quad Flat

(PM) Packages Using 0.5-mm

Center-to-Center Spacings and 68-Pin

Ceramic Quad Flat (HV) Packages Using

25-mil Center-to-Center Spacings.