丝印代码：ABTH182504A；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type

丝印代码：ABTH182504A；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type

丝印代码：ABTH182504A；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type

丝印代码：ABTH182504A；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type