SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F240 and ’BCT240 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F240 and ’BCT240 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F240 and ’BCT240 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS

文件：473 Kbytes Page：26 Pages

SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS

文件：473 Kbytes Page：26 Pages