丝印代码：1822002PYE；TPS7H2211-SP and TPS7H2211-SEP Radiation-Hardness-Assured (RHA) 14V, 3.5A eFuse

1 Features • Total ionizing dose (TID) characterized to 100krad(Si) – Radiation hardness assurance availability of 100krad(Si) • Single-event effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy t

丝印代码：1822002PYE；TPS7H2211-SP and TPS7H2211-SEP Radiation-Hardness-Assured (RHA) 14V, 3.5A eFuse

1 Features • Total ionizing dose (TID) characterized to 100krad(Si) – Radiation hardness assurance availability of 100krad(Si) • Single-event effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy t

AMPMODU II REC, CONTACT, HIGH PRESSURE, C.O.S.I.

文件：94.17 Kbytes Page：1 Pages

包装：散装 描述：CONN SOCKET 22-26AWG CRIMP TIN 连接器，互连器件 矩形连接器触头

Tin (Sn), Socket Contact, 26 – 22 AWG, .12 – .4 mm² Wire, 254.1 – 642.5 CMA, Discrete Wire, Crimp, Phosphor Bronze, Signal, AMPMODU IV/V

包装：散装 描述：CONN SOCKET 28-30AWG CRIMP TIN 连接器，互连器件 矩形连接器触头

胶壳端子

GaN Power Transistors

文件：693.67 Kbytes Page：7 Pages

2A ULTRA LOW DROPOUT LINEAR REGULATOR

文件：200.02 Kbytes Page：4 Pages