3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments (TIE) SCOPE E Family of Testability Products Members of the TI WidebusE Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V UBT E (U

3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments (TIE) SCOPE E Family of Testability Products
Members of the TI WidebusE Family
State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
Support Unregulated Battery Operation Down to 2.7 V

封装/外壳：64-TFSOP（0.240"，6.10mm 宽） 包装：管件 描述：IC SCAN TEST UNIV TXRX 64TSSOP 集成电路（IC） 通用总线功能

3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

文件：584.68 Kbytes Page：38 Pages

3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments (TIE) SCOPE E Family of Testability Products
Members of the TI WidebusE Family
State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
Support Unregulated Battery Operation Down to 2.7 V

3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

文件：584.68 Kbytes Page：38 Pages

3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

文件：548.92 Kbytes Page：34 Pages

3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments (TIE) SCOPE E Family of Testability Products
Members of the TI WidebusE Family
State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
Support Unregulated Battery Operation Down to 2.7 V

3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

文件：548.92 Kbytes Page：34 Pages