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SN74AUP1G80价格

参考价格:¥0.5208

型号:SN74AUP1G80DBVR 品牌:TI 备注:这里有SN74AUP1G80多少钱,2026年最近7天走势,今日出价,今日竞价,SN74AUP1G80批发/采购报价,SN74AUP1G80行情走势销售排行榜,SN74AUP1G80报价。
型号 功能描述 生产厂家 企业 LOGO 操作
SN74AUP1G80

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80

低功耗单路正边沿触发式 D 型触发器

The AUP family is TI’s premier solution to the industry’s low-power needs in battery-powered portable applications. This family assures a low static- and dynamic-power consumption across the entire VCC range of 0.8 V to 3.6 V, resulting in increased battery life (see AUP – The Lowest-Power Family). • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II\n• 2000-V Human-Body Model (A114-B, Class II)\n• Available in the Texas Instruments NanoStar™ Package\n• Low Dynamic-Power Consumption (Cpd = 4.3 pF Typical at 3.3 V)\n• Low Noise – Overshoot and Undershoot CC\n• Schmitt-Trigger Action All;

TI

德州仪器

SN74AUP1G80

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:1.17688 Mbytes Page:25 Pages

TI

德州仪器

SN74AUP1G80

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:375.36 Kbytes Page:14 Pages

TI

德州仪器

SN74AUP1G80

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:501.45 Kbytes Page:17 Pages

TI

德州仪器

SN74AUP1G80

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:924.25 Kbytes Page:26 Pages

TI

德州仪器

SN74AUP1G80

Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

文件:1.76827 Mbytes Page:41 Pages

TI

德州仪器

SN74AUP1G80

Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

文件:1.58232 Mbytes Page:38 Pages

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

丝印代码:H80R;SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

丝印代码:H80R;SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

丝印代码:H80R;SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

丝印代码:H80R;SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

丝印代码:H80R;SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

丝印代码:H80R;SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

丝印代码:HXN;SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

丝印代码:HXN;SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

SN74AUP1G80 Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

1 Features 1• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) • Available in the Texas Instruments NanoStar™ Package • Low Static-Power Consumption (ICC = 0.9

TI

德州仪器

Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

文件:1.76827 Mbytes Page:41 Pages

TI

德州仪器

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:501.45 Kbytes Page:17 Pages

TI

德州仪器

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:924.25 Kbytes Page:26 Pages

TI

德州仪器

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:1.17688 Mbytes Page:25 Pages

TI

德州仪器

Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

文件:1.58232 Mbytes Page:38 Pages

TI

德州仪器

Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

文件:1.58232 Mbytes Page:38 Pages

TI

德州仪器

Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

文件:1.76827 Mbytes Page:41 Pages

TI

德州仪器

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:1.17688 Mbytes Page:25 Pages

TI

德州仪器

丝印代码:H80R;Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

文件:1.76827 Mbytes Page:41 Pages

TI

德州仪器

Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

文件:1.58232 Mbytes Page:38 Pages

TI

德州仪器

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:924.25 Kbytes Page:26 Pages

TI

德州仪器

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:501.45 Kbytes Page:17 Pages

TI

德州仪器

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:375.36 Kbytes Page:14 Pages

TI

德州仪器

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:375.36 Kbytes Page:14 Pages

TI

德州仪器

丝印代码:H80R;Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

文件:1.76827 Mbytes Page:41 Pages

TI

德州仪器

Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

文件:1.58232 Mbytes Page:38 Pages

TI

德州仪器

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:1.17688 Mbytes Page:25 Pages

TI

德州仪器

封装/外壳:SC-74A,SOT-753 功能:标准 包装:卷带(TR) 描述:IC FF D-TYPE SNGL 1BIT SOT23-5 集成电路(IC) 触发器

TI

德州仪器

封装/外壳:SC-74A,SOT-753 功能:标准 包装:卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带 描述:IC FF D-TYPE SNGL 1BIT SOT23-5 集成电路(IC) 触发器

TI

德州仪器

Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

文件:1.58232 Mbytes Page:38 Pages

TI

德州仪器

丝印代码:H80R;Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

文件:1.76827 Mbytes Page:41 Pages

TI

德州仪器

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:1.17688 Mbytes Page:25 Pages

TI

德州仪器

LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

文件:375.36 Kbytes Page:14 Pages

TI

德州仪器

SN74AUP1G80产品属性

  • 类型

    描述

  • Technology Family:

    AUP

  • Supply voltage (Min) (V):

    0.8

  • Supply voltage (Max) (V):

    3.6

  • Input type:

    Standard CMOS

  • Output type:

    Push-Pull

  • Clock Frequency (Max) (MHz):

    260

  • IOL (Max) (mA):

    4

  • IOH (Max) (mA):

    -4

  • ICC (Max) (uA):

    0.9

  • Features:

    Balanced outputs

更新时间:2026-7-30 20:23:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TI
15+
BGA
2860
一级代理,专注军工、汽车、医疗、工业、新能源、电力
Texas Instruments
26+
-
18114
全新原装正品
TI
23+
BGA
5000
全新原装,支持实单,非诚勿扰
TI
2428+
SOT23-5
8500
只做原装正品现货或订货假一赔十!
TI(德州仪器)
26+
-
3600
十二年VIP会员,诚信经营,原装库存·可零售!
TI
25+
BGA
20000
原装
Texas Instruments
24+25+
16500
全新原厂原装现货!受权代理!可送样可提供技术支持!
TI/德州仪器
2402+
QFN
8324
原装正品!实单价优!
TI/德州仪器
24+
DSBGA
28347
只做全新原装进口现货
TI
23+
BGA
3200
正规渠道,只有原装!

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