Features

•Digital compensation of sensor offset, sensitivity,temperature drift, and nonlinearity

•Programmable analog gain and digital gain;accommodates bridges with spans < 1mV/V and high offset

•Many diagnostic features on chip (e.g., EEPROMsignature, bridge connection checks, bridge shortdetection, power loss detection)

•Independently programmable high and lowclipping levels

•24-bit customer ID field for module traceability

•Internal temperature compensation reference (noexternal components)

•Option for external temperature compensationwith addition of single diode

•Output options: rail-to-rail ratiometric analogvoltage (12-bit resolution), absolute analogvoltage, ZACwire™ digital one-wire interface

•Fast power-up to data out response; outputavailable 5ms after power-up

•Current consumption depends on programmedsample rate and mode: 1mA down to 300μA (typ.)

•Fast response time: 1.4ms typical

•High voltage protection: ≤ 30V with external JFET

•AEC-Q100 qualified