Features

• Electrically screened to SMD 5962-17208

• Acceptance tested to 100krad(Si) (HDR) and to 50krad(Si)

(LDR) wafer-by-wafer

• Integrated 5-bit to 32-channel decoder

• Integrated level shifting circuit

• High collector current outputs

• High voltage outputs

• Grounded metal lid

• Full military temperature range operation

- TA = -55°C to +125°C

- TJ = -55°C to +150°C

• Radiation tolerance

- HDR (50rad(Si)/s to 300rad(Si)/s) . . . . . . . . . 100krad(Si)

- LDR (0.01rad(Si)/s) . . . . . . . . . . . . . . . . . . . . . . . 50krad(Si)

• SEE hardness

- No SEB/SEL LETTH, VCE = 33V . . . . . . . 86.4MeV•cm2/mg