Features

• QML Qualified Per MIL-PRF-38535 Requirements

• 1.25Micron Radiation Hardened SOS CMOS

• Radiation Environment

- Latch-up Free Under any Conditions

- Total Dose . . . . . . . . . . . . . . . . . . . . . 3 x 105 RAD(Si)

- SEU Immunity . . . . . . . . . . .<1 x 10-10 Errors/Bit/Day

- SEU LET Threshold. . . . . . . . . . . >100MeV/(mg/cm2)

• Input Logic Levels. .VIL = (0.3V)(VCC), VIH = (0.7V)(VCC)

• Output Current . . . . . . . . . . . . . . . . . . . . . . . . . . . 16mA

• Quiescent Supply Current . . . . . . . . . . . . . . . . . . . 20A

• Propagation Delay . . . . . . . . . . . . . . . . . . . . . . . . . 9.0ns

Description

The Radiation Hardened ACS244MS is a Non-Inverting,

Octal, Three-State Buffer/Line Driver with two active-LOW

Enable inputs (AE and BE). Each Enable input controls four

outputs. When an Enable input is LOW, the corresponding

outputs are active. A HIGH on an Enable input causes the

corresponding outputs to be high impedance, regardless of

the input levels.

The ACS244MS is fabricated on a CMOS Silicon on Sapphire (SOS) process, which provides an immunity to Single

Event Latch-up and the capability of highly reliable performance in any radiation environment. These devices offer

significant power reduction and faster performance when

compared to ALSTTL types.

Specifications for Rad Hard QML devices are controlled

by the Defense Supply Center in Columbus (DSCC). The

SMD numbers listed below must be used when ordering.

Detailed Electrical Specifications for the ACS244 are

contained in SMD 5962-98541.