REF50xx Low-Noise, Very Low Drift, Wide VIN Precision Voltage Reference

1 Features • Low temperature drift (maximum): – Enhanced-grade: 2.5ppm/°C – High-grade: 3ppm/°C – Standard-grade: 8ppm/°C • High accuracy (maximum): – Enhanced-grade: 0.025% – High-grade: 0.05% – Standard-grade: 0.1% • Low noise: – Enhanced-grade: 0.5μVPP/V – High/Standard-g

REF50xx Low-Noise, Very Low Drift, Wide VIN Precision Voltage Reference

1 Features • Low temperature drift (maximum): – Enhanced-grade (New): 2.5ppm/°C – High-grade: 3ppm/°C – Standard-grade: 8ppm/°C • High accuracy (maximum): – Enhanced-grade: 0.025% – High-grade: 0.05% – Standard-grade: 0.1% • Low noise: – Enhanced-grade: 0.5μVPP/V – High/Stan

REF50xx Low-Noise, Very Low Drift, Wide VIN Precision Voltage Reference

1 Features • Low temperature drift (maximum): – Enhanced-grade (New): 2.5ppm/°C – High-grade: 3ppm/°C – Standard-grade: 8ppm/°C • High accuracy (maximum): – Enhanced-grade: 0.025% – High-grade: 0.05% – Standard-grade: 0.1% • Low noise: – Enhanced-grade: 0.5μVPP/V – High/Stan

REF50xx Low-Noise, Very Low Drift, Wide VIN Precision Voltage Reference

1 Features • Low temperature drift (maximum): – Enhanced-grade (new): 2.5ppm/°C – High-grade: 3ppm/°C – Standard-grade: 8ppm/°C • High accuracy (maximum): – Enhanced-grade: 0.025% – High-grade: 0.05% – Standard-grade: 0.1% • Low noise: – Enhanced-grade: 0.5μVPP/V – High/stan

封装/外壳：8-TSSOP，8-MSOP（0.118"，3.00mm 宽） 包装：卷带（TR） 描述：IC VREF SERIES 0.1% 8VSSOP 集成电路（IC） 电压基准

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REF50xx Low-Noise, Very Low Drift, Wide VIN Precision Voltage Reference

1 Features • Low temperature drift (maximum): – Enhanced-grade (new): 2.5ppm/°C – High-grade: 3ppm/°C – Standard-grade: 8ppm/°C • High accuracy (maximum): – Enhanced-grade: 0.025% – High-grade: 0.05% – Standard-grade: 0.1% • Low noise: – Enhanced-grade: 0.5μVPP/V – High/stan

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(THM)THRU HOLE MOUNT TEST POINTS-COLOR KEYED •Color keyed for visibility and quick identification •Economical choice for PC test point terminations •Snap-fit mounting provides positive retention for wave soldering •Wire form loop for safe, non-sliptesting •Space saving, ultra low

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