SN54SLC8T245-SEP 8-Bit Dual-Supply Bus Transceiver With Configurable Voltage Translation and Tri-State Outputs

1 Features • VID V62/22604 • Radiation tolerant: – Single event latch-up (SEL) immune up to 43 MeV-cm2 /mg at 125°C – Total ionizing dose (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 20 krad(Si) • Qualified, fully configurable dual-rail design allows each port t

SN54SLC8T245-SEP 8-Bit Dual-Supply Bus Transceiver With Configurable Voltage Translation and Tri-State Outputs

1 Features • VID V62/22604 • Radiation tolerant: – Single event latch-up (SEL) immune up to 43 MeV-cm2 /mg at 125°C – Total ionizing dose (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 20 krad(Si) • Qualified, fully configurable dual-rail design allows each port t

SN54SLC8T245-SEP 8-Bit Dual-Supply Bus Transceiver With Configurable Voltage Translation and Tri-State Outputs

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SN54SLC8T245-SEP 8-Bit Dual-Supply Bus Transceiver With Configurable Voltage Translation and Tri-State Outputs

1 Features • VID V62/22604 • Radiation tolerant: – Single event latch-up (SEL) immune up to 43 MeV-cm2 /mg at 125°C – Total ionizing dose (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 20 krad(Si) • Qualified, fully configurable dual-rail design allows each port t

SN54SLC8T245-SEP 8-Bit Dual-Supply Bus Transceiver With Configurable Voltage Translation and Tri-State Outputs

1 Features • VID V62/22604 • Radiation tolerant: – Single event latch-up (SEL) immune up to 43 MeV-cm2 /mg at 125°C – Total ionizing dose (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 20 krad(Si) • Qualified, fully configurable dual-rail design allows each port t