1. General description

The 74LVC1G00-Q100 is a single 2-input NAND gate. Inputs can be driven from either 3.3 V or

5 V devices. This feature allows the use of these devices as translators in mixed 3.3 V and 5 V

environments. Schmitt-trigger action at all inputs makes the circuit tolerant of slower input rise and

fall times. This device is fully specified for partial power down applications using IOFF. The IOFF

circuitry disables the output, preventing the potentially damaging backflow current through the

device when it is powered down.

This product has been qualified to the Automotive Electronics Council (AEC) standard Q100

(Grade 1) and is suitable for use in automotive applications.

2. Features and benefits

• Automotive product qualification in accordance with AEC-Q100 (Grade 1)

• Specified from -40 °C to +85 °C and from -40 °C to +125 °C

• Wide supply voltage range from 1.65 V to 5.5 V

• Overvoltage tolerant inputs to 5.5 V

• High noise immunity

• CMOS low power dissipation

• IOFF circuitry provides partial Power-down mode operation

• ±24 mA output drive (VCC = 3.0 V)

• Latch-up performance exceeds 250 mA

• Direct interface with TTL levels

• Complies with JEDEC standard:

• JESD8-7 (1.65 V to 1.95 V)

• JESD8-5 (2.3 V to 2.7 V)

• JESD8C (2.7 V to 3.6 V)

• JESD36 (4.5 V to 5.5 V)

• ESD protection:

• HBM: ANSI/ESDA/JEDEC JS-001 class 2 exceeds 2000 V

• CDM: ANSI/ESDA/JEDEC JS-002 class C3 exceeds 1000 V