1. General description

The 74HC377-Q100; 74HCT377-Q100 is an octal positive-edge triggered D-type flip-flop. The

device features clock (CP) and data enable (E) inputs. When E is LOW, the outputs Qn assume

the state of their corresponding Dn inputs that meet the set-up and hold time requirements on

the LOW-to-HIGH clock (CP) transition. Input E must be stable one set-up time prior to the

LOW-to-HIGH transition for predictable operation. Inputs include clamp diodes that enable the use

of current limiting resistors to interface inputs to voltages in excess of VCC.

This product has been qualified to the Automotive Electronics Council (AEC) standard Q100

(Grade 1) and is suitable for use in automotive applications.

2. Features and benefits

• Automotive product qualification in accordance with AEC-Q100 (Grade 1)

• Specified from -40 °C to +85 °C and from -40 °C to +125 °C

• Wide supply voltage range from 2.0 V to 6.0 V

• CMOS low power dissipation

• High noise immunity

• Latch-up performance exceeds 100 mA per JESD 78 Class II Level B

• Complies with JEDEC standards:

• JESD8C (2.7 V to 3.6 V)

• JESD7A (2.0 V to 6.0 V)

• Common clock and master reset

• Eight positive edge-triggered D-type flip-flops

• Input levels:

• For 74HC377-Q100: CMOS level

• For 74HCT377-Q100: TTL level

• ESD protection:

• MIL-STD-883, method 3015 exceeds 2000 V

• HBM JESD22-A114F exceeds 2000 V

• MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)