Array Structure Parametric Test Option

Introduction The decreasing size of features on integrated circuits (45 nm and smaller) is driving the need for new parametric test capabilities. These capabilities must accommodate the advanced test structures developed for fast yield ramp up in process integration as well as process monitorin

50 Ohm Wireless Transmission Coax, RG-58, 20 AWG Solid BC, 80 BC Braid, PVC Jkt

Product Description 50 Ohm Wireless Transmission Coax, RG-8, 20 AWG Bare Copper Conductor, PE Insulation, 80 Bare Copper Braid Shield, PVC Jacket

Drive Fasteners

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Multi-ranging operation

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Multi-Range Programmable DC Power Supplies

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Toggle Switches

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