GENERAL DESCRIPTION

The MT28F322D20 and MT28F322D18 are highperformance, high-density, nonvolatile Flash memory solutions that can significantly improve system performance. This new architecture features a two-memory-bank configuration that supports dual-bank operation with no latency.

FEATURES

• Flexible dual-bank architecture

– Support for true concurrent operation with zero latency

– Read bank a during program bank b and vice versa

– Read bank a during erase bank b and vice versa

• Basic configuration: Seventy-one erasable blocks

– Bank a (8Mb for data storage)

– Bank b (24Mb for program storage)

• VCC, VCCQ, VPP voltages

– 1.70V (MIN), 1.90V (MAX) VCC, VCCQ (MT28F322D18 only)

– 1.80V VCC, VCCQ (MIN); 2.20V VCC (MAX)and 2.25V VCCQ (MAX) (MT28F322D20 only)

– 0.9V (TYP) VPP (in-system PROGRAM/ERASE)

– 12V ±5 (HV) VPP tolerant (factory programming compatibility)

• Random access time: 70ns/80ns @ 1.70V VCC

• Burst Mode read access (MT28F322D20)

– MAX clock rate: 54 MHz (tCLK = 18.5ns)

– Burst latency: 70ns @ 1.80V VCC and 54 MHz

– tACLK: 17ns @ 1.80V VCC and 54 MHz

• Page Mode read access1

– Eight-word page

– Interpage read access: 70ns/80ns @ 1.80V

– Intrapage read access: 30ns @ 1.80V

• Low power consumption (VCC = 2.20V)

– Asynchronous READ < 15mA (MAX)

– Standby < 50µA

– Automatic power saving feature (APS)

• Enhanced write and erase suspend options

– ERASE-SUSPEND-to-READ within same bank

– PROGRAM-SUSPEND-to-READ within same bank

– ERASE-SUSPEND-to-PROGRAM within same bank

• Dual 64-bit chip protection registers for security purposes

• Cross-compatible command support

– Extended command set

– Common flash interface

• PROGRAM/ERASE cycle

– 100,000 WRITE/ERASE cycles per block