Microprocessor Supervisory Circuits

General Description The MAX690 family of supervisory circuits reduces the complexity and number of components required for power supply monitoring and battery control functions in microprocessor systems. These include µP reset and backup-battery switchover, watchdog timer, CMOS RAM write protecti

Microprocessor Supervisory Circuits

文件：882.69 Kbytes Page：18 Pages

Loop-Powered 4.20 mA Sensor Transmitter

PRODUCT DESCRIPTION The AD693 is a monolithic signal conditioning circuit which accepts low-level inputs from a variety of transducers to control a standard 4–20 mA, two-wire current loop. An on-chip voltage reference and auxiliary amplifier are provided for transducer excitation; up to 3.5 mA of

Microprocessor Supervisory Circuits

GENERAL DESCRIPTION The ADM690–ADM695 family of supervisory circuits offers complete single chip solutions for power supply monitoring and battery control functions in microprocessor systems. These functions include µP reset, backup battery switchover, watchdog timer, CMOS RAM write protection, a

Microprocessor Supervisory Circuits

GENERAL DESCRIPTION The ADM690–ADM695 family of supervisory circuits offers complete single chip solutions for power supply monitoring and battery control functions in microprocessor systems. These functions include µP reset, backup battery switchover, watchdog timer, CMOS RAM write protection, a

500 MHz Monolithic Dual Pin Electronics Driver

Description The Edge693 is a dual pin electronics driver solution manufactured in a high-performance, complementary bipolar process. In Automatic Test Equipment (ATE applications, the Edge693 offers two pin drivers suitable for drive-only channels in memory testers, as well as fo bidirectional ch

500 MHz Monolithic Dual Pin Electronics Driver

Description The Edge693 is a dual pin electronics driver solution manufactured in a high-performance, complementary bipolar process. In Automatic Test Equipment (ATE applications, the Edge693 offers two pin drivers suitable for drive-only channels in memory testers, as well as fo bidirectional ch