Product Description

The KX222-1054 is a tri-axis ±8g, ±16g or ±32g silicon micromachined

accelerometer with integrated 2048 byte buffer, orientation, tap/double

tap, activity detecting, and Free fall algorithms. The sense element is

fabricated using Kionix’s proprietary plasma micromachining process

technology. Acceleration sensing is based on the principle of a differential

capacitance arising from acceleration-induced motion of the sense

element, which further utilizes common mode cancellation to decrease

errors from process variation, temperature, and environmental stress. The

sense element is hermetically sealed at the wafer level by bonding a

second silicon lid wafer to the device using a glass frit. A separate ASIC

device packaged with the sense element provides signal conditioning, and

intelligent user-programmable application algorithms. The accelerometer

is delivered in a 2 x 2 x 0.9 mm LGA plastic package operating from a 1.71

– 3.6V DC supply. Voltage regulators are used to maintain constant

internal operating voltages over the range of input supply voltages. This results in stable operating

characteristics over the range of input supply voltages. I

2C or SPI digital protocol is used to communicate

with the chip to configure and check for updates to the orientation, Directional TapTM detection, Free fall

detection and activity monitoring algorithms.

Features

 2 x 2 x 0.9 mm LGA

 User-selectable g Range up to ± 32g

 User-selectable Output Data Rate up to 25600Hz

 User-selectable low power or high resolution mode

 Digital High-Pass Filter Outputs

 Extra large embedded 2048 byte FIFO/FILO buffer

 Low Power Consumption with FlexSet™ Performance Optimization

 Internal voltage regulator

 Enhanced integrated Free fall, Directional Tap/Double-TapTM, and Device-orientation Algorithms

 User-configurable wake-up function

 Digital I2C up to 3.4MHz

 Digital SPI up to 10MHz

 Lead-free Solderability

 Excellent Temperature Performance

 High Shock Survivability

 Factory Programmed Offset and Sensitivity

 Self-test Function