Description

The HFA5250 is the ideal monolithic pin driver solution for high performance test systems. The device will switch at high data rates between two input voltage levels providing variable amplitude pulses. The output impedance is trimmed to achieve a precision 50Ω source for impedance matching. Two differential ECL/TTL compatible inputs control the operation of the HFA5250, one controlling the VHIGH/VLOW switching and the other controlling the output’s high-impedance state. The HFA5250’s 500MHz data rate makes it compatible with today’s high speed VLSI test systems and the +7V to -2V output swing allows testing of all common logic families.

Features

• High Digital Data Rate . . . . . . . . . . . . . . . . . . . . 500MHz

• Very Fast Slew Rate. . . . . . . . . . . . . . . . . . . . . 2500V/µs

• Very Fast Rise/Fall Times . . . . . . . . . . . . . . . . . . . 600ps

• Wide Output Range . . . . . . . . . . . . . . . . . . . . +7V to -2V

• Precise 50Ω Output Impedance

• High Impedance, Three-State Output Control

Applications

• IC Tester Pin Electronics

• Pattern Generators

• Pulse Generators

• Built-In Test Equipment (BITE)

• Level Comparator/Translator