Description

The Intersil HCTS30MS is a Radiation Hardened 8-Input NAND Gate. A high on all input forces the output to a low state.

The HCTS30MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family.

Features

• 3 Micron Radiation Hardened SOS CMOS

• Total Dose 200K RAD (Si)

• SEP Effective LET No Upsets: >100 MEV-cm2/mg

• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ)

• Dose Rate Survivability: >1 x 1012 RAD (Si)/s

• Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse

• Latch-Up Free Under Any Conditions

• Military Temperature Range: -55°C to +125°C

• Significant Power Reduction Compared to LSTTL ICs

• DC Operating Voltage Range: 4.5V to 5.5V

• LSTTL Input Compatibility

    - VIL = 0.8V Max

    - VIH = VCC/2 Min

• Input Current Levels Ii ≤ 5µA at VOL, VOH