General Description

The SCAN182541A is a high performance BiCMOS line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented paired output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary-Scan architecture with the incorporation of the defined Boundary-Scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features

■ IEEE 1149.1 (JTAG) Compliant

■ High performance BiCMOS technology

■ 25Ω series resistor outputs eliminate need for external terminating resistors

■ Dual output enable signals per byte

■ 3-STATE outputs for bus-oriented applications

■ 25 mil pitch SSOP (Shrink Small Outline Package)

■ Includes CLAMP, IDCODE and HIGHZ instructions

■ Additional instructions SAMPLE-IN, SAMPLE-OUT and EXTEST-OUT

■ Power up 3-STATE for hot insert

■ Member of Fairchild’s SCAN Products