General Description

The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features

■ High performance BiCMOS technology

■ 25Ω series resistors in outputs eliminate the need for

external terminating resistors

■ Dual output enable control signals

■ 3-STATE outputs for bus-oriented applications

■ 25 mil pitch SSOP (Shrink Small Outline Package)

■ IEEE 1149.1 (JTAG) Compliant

■ Includes CLAMP, IDCODE and HIGHZ instructions

■ Additional instructions SAMPLE-IN, SAMPLE-OUT and

EXTEST-OUT

■ Power Up 3-STATE for hot insert

■ Member of Fairchild’s SCAN Products