丝印代码：D53508；DACx3508 Octal, 8-Bit, 10-Bit, and 12-Bit, SPI, Buffered Voltage Output DACs in Tiny 3 × 3 WQFN Package

1 Features • ±1LSB DNL • Wide operating range: – Power supply: 1.8V to 5.5V – Temperature range: –40°C to +125°C • 3-wire serial peripheral interface (SPI) – VIH = 2.4V for 2.7V ≤ VDD ≤ 5.5V – VIH = (VDD – 0.3V ) for 1.8V ≤ VDD ≤ 2.7V • LDAC pin for simultaneous output update • Very low p

丝印代码：D53508；DACx3508 Octal, 8-Bit, 10-Bit, and 12-Bit, SPI, Buffered Voltage Output DACs in Tiny 3 × 3 WQFN Package

1 Features • ±1LSB DNL • Wide operating range: – Power supply: 1.8V to 5.5V – Temperature range: –40°C to +125°C • 3-wire serial peripheral interface (SPI) – VIH = 2.4V for 2.7V ≤ VDD ≤ 5.5V – VIH = (VDD – 0.3V ) for 1.8V ≤ VDD ≤ 2.7V • LDAC pin for simultaneous output update • Very low p

丝印代码：D53508；DACx3508 Octal, 10-Bit or 8-Bit, SPI Interface, Buffered Voltage Output DACs in Tiny 3 횞 3 WQFN Package

文件：3.93133 Mbytes Page：38 Pages

丝印代码：D53508；DACx3508 Octal, 8-Bit, 10-Bit, and 12-Bit, SPI, Buffered Voltage Output DACs in Tiny 3 × 3 WQFN Package

1 Features • ±1LSB DNL • Wide operating range: – Power supply: 1.8V to 5.5V – Temperature range: –40°C to +125°C • 3-wire serial peripheral interface (SPI) – VIH = 2.4V for 2.7V ≤ VDD ≤ 5.5V – VIH = (VDD – 0.3V ) for 1.8V ≤ VDD ≤ 2.7V • LDAC pin for simultaneous output update • Very low p

DACx3508 Octal, 10-Bit or 8-Bit, SPI Interface, Buffered Voltage Output DACs in Tiny 3 횞 3 WQFN Package

文件：3.93133 Mbytes Page：38 Pages

丝印代码：D53508；DACx3508 Octal, 10-Bit or 8-Bit, SPI Interface, Buffered Voltage Output DACs in Tiny 3 횞 3 WQFN Package

文件：3.93133 Mbytes Page：38 Pages

PPMU Circuit

GENERAL DESCRIPTION The AD53508 is a custom dual-channel parametric measurement circuit for use in semiconductor automatic test equipment. It contains programmable modes to force a pin voltage and measure its current or to integrate and hold a current value. Alternatively, a current can be forced

PPMU Circuit

GENERAL DESCRIPTION The AD53508 is a custom dual-channel parametric measurement circuit for use in semiconductor automatic test equipment. It contains programmable modes to force a pin voltage and measure its current or to integrate and hold a current value. Alternatively, a current can be forced

SOLID STATE POWER CONTROLLERS

文件：177.42 Kbytes Page：5 Pages