Description

The 100 series EMC probes are designed for identifying and fixing EMC problems. The 100A, 100B, and 100C are loop probes, and are sensitive to magnetic fields. The 100D is a stub probe, and is sensitive to electric fields.

The loop probes have integrated electrostatic shields, providing isolation from commonmode signals. As a result, these probes deliver excellent repeatability. The different loop sizes allow the user to select the optimum probe for a given frequency, providing the optimum sensitivity and spatial resolution.

The 100D stub probe, with its narrow tip, offers the highest spatial resolution. It is ideally suited to tasks such as tracking EMC sources down to the individual pins of an IC.

Because of the planar construction of the probes, even the large loops are only 0.11” thick, allowing the probe to be inserted into narrow seams and gaps.

Features

• An integrated electrostatic shield in the loop probes eliminates common-mode pickup.

• Multiple loop sizes offer optimum sensitivity and spatial resolution at different frequencies.

• Probe dimensions optimized for access to tight spaces.

• Calibrated sensitivity up to 3 GHz, depending on model. Usable to beyond 6 GHz.

• Can be driven by a signal source to generate fields for electromagnetic susceptibility testing.

Applications

• Finding sources of EMC emissions problems.

• Injecting fields into circuits to identify those which are EMC-susceptible.

• Noninvasive probing of RF circuits. The probes can be used to measure the signals present on an operational PC board. For example, using a preamplifier, the probes can measure the characteristics of an oscillator, such as frequency, sidebands, and phase noise.