GENERAL DESCRIPTION

The ADM1065 Super Sequencer® is a configurable supervisory/sequencing device that offers a single-chip solution for supply monitoring and sequencing in multiple-supply systems.

The device also provides up to 10 programmable inputs for monitoring undervoltage faults, overvoltage faults, or out-of-window faults on up to 10 supplies. In addition, 10 programmable outputs can be used as logic enables. Six of these programmable outputs can each provide up to a 12 V output for driving the gate of an N-FET that can be placed in the path of a supply.

FEATURES

Complete supervisory and sequencing solution for up to

10 supplies

10 supply fault detectors enable supervision of supplies to

<0.5 accuracy at all voltages at 25°C

<1.0 accuracy across all voltages and temperatures

5 selectable input attenuators allow supervision of supplies to

14.4 V on VH

6 V on VP1 to VP4 (VPx)

5 dual-function inputs, VX1 to VX5 (VXx)

High impedance input to supply fault detector with

thresholds between 0.573 V and 1.375 V

General-purpose logic input

10 programmable driver outputs, PDO1 to PDO10 (PDOx)

Open-collector with external pull-up

Push/pull output driven to VDDCAP or VPx

Open collector with weak pull-up to VDDCAP or VPx

Internally charge-pumped high drive for use with external

N-FET (PDO1 to PDO6 only)

Sequencing engine (SE) implements state machine control of

PDO outputs

State changes conditional on input events

Enables complex control of boards

Power-up and power-down sequence control

Fault event handling

Interrupt generation on warnings

Watchdog function can be integrated in SE

Program software control of sequencing through SMBus

Device powered by the highest of VPx, VH for improved

redundancy

User EEPROM: 256 bytes

Industry-standard 2-wire bus interface (SMBus)

Guaranteed PDO low with VH, VPx = 1.2 V

Available in 40-lead, 6 mm × 6 mm LFCSP and

48-lead, 7 mm × 7 mm TQFP packages

APPLICATIONS

Central office systems

Servers/routers

Multivoltage system line cards

DSP/FPGA supply sequencing

In-circuit testing of margined supplies