GENERAL DESCRIPTION

The ADATE324 is a complete, single-chip, quad-channel automatic

test equipment (ATE) solution that performs the pin electronics

(PE) functions of a driver, a comparator, and an active load (DCL).

The device also features a high voltage (VHH) drive capability

per chip to support flash memory testing applications. Dedicated

16-bit digital-to-analog converters (DACs) with on-chip calibration

registers provide all the necessary dc levels for operation of the

device.

The voltage driver features three active states: high, low, and terminate

mode, as well as a high impedance inhibit state. The inhibit

state, in conjunction with the integrated dynamic clamps, facilitates

significant attenuation of transmission line reflections when the

driver is not actively terminating the line. The open circuit drive

capability is −1.5 V to +4.5 V to accommodate the standard range

of ATE and instrumentation applications.

The ADATE324 can be used as a quad, single-ended, pin electronics

channel or as a dual differential channel. In additional to per

channel, high speed window comparators, the ADATE324 provides

two programmable threshold differential comparators for differential

ATE applications.

All dc levels for DCL functions are generated by dedicated onchip

16-bit DACs. To facilitate accurate programming levels, the

ADATE324 also includes an integrated calibration function to correct

for gain and offset errors of each functional block. Correction

coefficients can be stored on chip, and any values written to the

DACs are automatically adjusted using the appropriate correction

factors.

The ADATE324 uses a serial programmable interface (SPI) bus

to program all functional blocks, DACs, and on-chip calibration

constants. The device also has an on-chip temperature sensor,

and overvoltage and undervoltage fault clamps, for monitoring and

reporting the device temperature, and any output pin voltage faults

that may occur during operation.

FEATURES

► 2 selectable data rates up to 1.6 GHz or 3.2 Gbps maximum toggle rate

► DCL disable mode (low leakage typically <10 nA)

► Power and speed programmable (driver and comparators active)

► 1.025 W power dissipation per channel low speed (Case A)

► 1.125 W power dissipation per channel high speed (Case B)

► Voltage driver

► 3-level driver with high-Z and reflection clamps

► Voltage range: –1.5 V to +4.5 V (+5 V extended range)

► Precision trimmed output resistance

► Functional amplitude (VIH – VIL): 0.05 V minimum to 6.0 V maximum

► 312.5 ps minimum pulse width (1.0 V programmed swing)

► 26 ps deterministic jitter and 1.4 ps random jitter

► Comparator

► Differential and single-ended window modes

► Input voltage range: –1.5 V to +4.5 V (+5 V extended range)

► 130 ps ERT/EFT normal window comparator 1.0 V, terminated

► Active load: ±12 mA current range

► VHH drive

► Dedicated VHH output pin

► Voltage range: 0.0 V to 13.5 V

► DC levels

► Fully integrated and dedicated 16-bit DACs

► On-chip gain and offset calibration registers with automatic add and multiply functions

► Package: 9 mm × 9 mm, 121-ball chip scale package ball grid array [CSP_BGA]

APPLICATIONS

► ATE

► Semiconductor and board test systems

► Instrumentation and characterization equipment