FEATURES

► High performance

► Throughput: 40 MSPS, 46.25 ns conversion latency

► INL: ±4 ppm (typical), ±8 ppm (maximum)

► SNR/THD

► 93.6 dB (typical)/−110 dB (typical) at fIN = 1 kHz

► 93.5 dB (typical)/−104 dB (typical) at fIN = 1 MHz

► Noise spectral density: −167.6 dBFS/Hz

► 20-bit resolution, no missing codes

► Low power

► 79.3 mW typical at 40 MSPS with −0.5 dBFS sine-wave input

► Easy Drive, fully differential Input

► 6 V p-p differential input range

► Continuous signal acquisition

► Linearized, 5 μA/MSPS input current

► Integrated, low-drift reference buffer and decoupling

► Integrated VCM generation

► Digital features and data interface

► Conversion result FIFO, 16K sample depth

► Digital averaging filter with up to 210 decimation

► SPI configuration

► Configurable data interface

► Single lane, DDR, serial LVDS, 800 MBPS per lane

► Dual lane, DDR, serial LVDS, 400 MBPS per lane

► Single/quad lane SPI data interface

► Package

► 49-ball, 5 mm x 5 mm CSP_BGA, 0.65 mm pitch

► Integrated supply decoupling capacitors

► Operating temperature range: −40°C to +85°C

APPLICATIONS

► Digital imaging

► Cell analysis

► Spectroscopy

► Automated test equipment

► High speed data acquisition

► Digital control loops, hardware in the loop

► Power quality analysis

► Source measurement units

► Electron and x-ray microscopy

► Radar level measurement

► Nondestructive test

► Predictive maintenance and structural health