丝印代码：ACT8990；TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Control Operation of Up to Six Parallel Target Scan Paths Accommodate Pipeline Delay to Target of Up to 31 Clock Cycl

丝印代码：ACT8990；TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Control Operation of Up to Six Parallel Target Scan Paths Accommodate Pipeline Delay to Target of Up to 31 Clock Cycl

丝印代码：ACT8990；TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Control Operation of Up to Six Parallel Target Scan Paths Accommodate Pipeline Delay to Target of Up to 31 Clock Cycl

丝印代码：ACT8990；TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Control Operation of Up to Six Parallel Target Scan Paths Accommodate Pipeline Delay to Target of Up to 31 Clock Cycl

Finger lever valve

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8990B Peak Power Analyzer and N1923A/N1924A Wideband Power Sensors

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RF AMPLIFIER MODEL

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