Dual-Die Programmable Linear Hall IC with Advanced Diagnostics for Safety-Critical Applications

The A1346 is the ideal solution for safety-critical applications. It incorporates full die redundancy with the added benefits of advanced diagnostics. The combination of these two features allow for a higher level of diagnostics without interruption to the application (where diagnostics would otherw \n• In the event of a die failure, self-diagnostics allow the controller to discern which die to continue to trust\n• For all features below, these refer to each of the two die in the package\n• High-speed analog, A-to-D converter (ADC), and digital architectures, enabling user-selectable bandwidth ;

Dual-Die Programmable Linear Hall IC with Advanced Diagnostics for Safety-Critical Applications

文件：1.53882 Mbytes Page：48 Pages

Dual-Die Programmable Linear Hall IC with Advanced Diagnostics for Safety-Critical Applications

文件：1.53882 Mbytes Page：48 Pages

封装/外壳：14-TSSOP（0.173"，4.40mm 宽） 包装：散装 描述：SENSOR HALL ANALOG 14TSSOP 传感器，变送器 磁性传感器 - 线性，罗盘（IC）

Pigtailed PIN Photodiodes

文件：181.92 Kbytes Page：5 Pages

Pigtailed PIN Photodiodes

文件：181.92 Kbytes Page：5 Pages

Pigtailed PIN Photodiodes

文件：181.92 Kbytes Page：5 Pages

Pigtailed PIN Photodiodes

文件：181.92 Kbytes Page：5 Pages

Pigtailed PIN Photodiodes

文件：181.92 Kbytes Page：5 Pages