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型号 功能描述 生产厂家 企业 LOGO 操作
5962R1722002PYE

TPS7H2201-SP and TPS7H2201-SEP Radiation Hardened 1.5-V to 7-V, 6-A eFuse

1 Features • Standard micro circuit available, SMD 5962R17220 • Vendor item drawing available, VID V62/23608 • Radiation performance: – Radiation hardness assurance (RHA) up to TID 100 krad(Si) – Single event latchup (SEL), single event burnout (SEB), and single event gate rupture (SEGR)

TI

德州仪器

5962R1722002PYE

丝印代码:1722002PYE;TPS7H2201-SP and TPS7H2201-SEP Radiation Hardened 1.5V to 7V, 6A eFuse

1 Features • Standard micro circuit available, SMD 5962R17220 • Vendor item drawing available, VID V62/23608 • Radiation performance: – Radiation hardness assurance (RHA) up to TID 100krad(Si) – Single event latchup (SEL), single event burnout (SEB), and single event gate rupture (SEGR) i

TI

德州仪器

5962R1722002PYE

丝印代码:1722002PYE;TPS7H2201-SP and TPS7H2201-SEP Radiation Hardened 1.5V to 7V, 6A eFuse

1 Features • Standard micro circuit available, SMD 5962R17220 • Vendor item drawing available, VID V62/23608 • Radiation performance: – Radiation hardness assurance (RHA) up to TID 100krad(Si) – Single event latchup (SEL), single event burnout (SEB), and single event gate rupture (SEGR) i

TI

德州仪器

TPS7H2201-SP and TPS7H2201-SEP Radiation Hardened 1.5V to 7V, 6A eFuse

1 Features • Standard micro circuit available, SMD 5962R17220 • Vendor item drawing available, VID V62/23608 • Radiation performance: – Radiation hardness assurance (RHA) up to TID 100krad(Si) – Single event latchup (SEL), single event burnout (SEB), and single event gate rupture (SEGR) i

TI

德州仪器

更新时间:2026-7-24 23:01:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TI
25+
N/A
21000
正规渠道,免费送样。支持账期,BOM一站式配齐
TI
25+
N/A
20948
样件支持,可原厂排单订货!
KEYSTONE
2450+
NA
9850
只做原厂原装正品现货或订货假一赔十!
Keystone
25+
6000
全新原装鄙视假货15118075546
WICKMANN
25+
NA
1106
专做原装正品,假一罚百!
TE/泰科
26+
NA
360000
只有原装
KEYSTONEELECTRONICS
22+
N/A
8163
现货,原厂原装假一罚十!
TE/泰科
2608+
/
275591
一级代理,原装现货
TE/泰科
24+
11380
原厂现货渠道
KEYSTONE ELECTRONICS
25+
N/A
20000
原装

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